Your source for burn-in systems, burn-in boards, burn-in board testers, custom test equipment and fixtures, and system design services. We have over 25 years of experience supplying state of the art burn-in and test systems to some of the leading technology companies in the world. Over 1000 systems have been installed world wide at such industry leaders as Agilent Technologies,
AMIS, Apple Computers, Altera, Ciena, ETRI, HMC, IBM, Nortel, Samsung, Sun Microsystems, Hitachi, Sandia National Labs,
Sandisk, Raytheon, and more...
Optimum product family
of test equipment supports a wide range of applications in component screening and process evaluation. OPTIMUM systems may be used both for production screening as well as engineering test. Any electronic product requiring either production screening or process/design evaluation through electrical and environmental stress may be processed in an OPTIMUM burn-in and test system.
Both BIS and JTAG protocols are
supported through OPCTL test
extensions for maximum versatility
of the Optimum burn-in
Microtechnology's systems provide a wide range of environments and functionality: 85/85, HAST, automated thermal cycling, integrated functional testing with temperature profiles, margin testing over temperature.
Testing solutions available over the temperature range of -55 through 350 degrees centigrade.
System and board designs can accommodate both standard and custom package configurations including bare die.
The AMT mechanical design team has designed custom high temperature sockets with probe centers as small as 20 mils. We also have the support of all major socket suppliers should you have a part requiring standard or near standard designs. Our design support staff would be happy to evaluate your specific need to find the most cost effective solution.
AMT's engineering staff
has produced over 4000 standard and custom burn-in boards designs for all types of burn-in equipment. Let us quote your next burn-in board requirement. All boards are fabricated, assembled, and electrically tested to exacting standards.
Our system design group has achieved many firsts in the evolution of AMT's burn-in technology. Our VLSI512 system which featured 512 I/O test channels when introduced, exceeded our nearest rival by 256 I/O. The 200 CT was the first system to integrate IDDQ parametrics with functional test for memories.
provides fully automated burn-in
with WEB access monitoring.
This remote monitoring
capability augments your ability
to follow your critical
from your desktop computer.